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Keithley Webcast Seminar Explores how to avoid Parallel Test Implementation Pitfalls

2009-03-26 10:13:09
Reader Contact:                        Editorial Contacts: Keithley Instruments PRismaPR UK PRismaPR   Monika Cunnington Gabriele Amelunxen Phone: +49-89-84 93 07-40 Phone: +44-1462-64 07 79 Tel.: +49-8106-24 72 33 info@keithley.de monika@prismapr.com info@prismapr.com     Press Release 7/2009   Keithley Webcast Seminar Explores how to
Avoid Parallel Test Implementation Pitfalls Cleveland, Ohio, March 19, 2009    * * *    Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a webcast seminar titled “Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test” on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing. To register for this event, visit www.keithley.com/events/semconfs/webseminars. When their test capacity needs increase, production test engineers often look to parallel test for a solution. However, they may not achieve their hoped-for throughput gains if they neglect to identify throughput limiters, understand test structure interdependencies, and consider data management. Participants in this seminar will learn how to optimize existing test resources to increase throughput, where to add resources to maximize those gains, and alternatives to a traditional single system controller to eliminate bottlenecks in data management and resource configuration. The seminar will also cover how to use triggering to achieve critical test sequence timing and selection criteria for test resources that maximize parallel test investment. The event will conclude with a text-based Q&A session. This seminar is recommended for test engineers and test engineering managers who are contemplating a move to parallel test. The content is appropriate for engineers working with on-wafer or packaged devices.     About the Presenter Jennifer Makupson is a senior applications engineer at Keithley. She has been serving customers in the test and measurement industry since she joined the company in 2001. Keithley Instruments, Inc., a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (I‑V), capacitance-voltage (C-V), and pulsed I-V measurements and analysis. Products range from benchtop instruments to turn-key systems and are used in applications as diverse as materials analysis, device characterization, wafer level reliability, and process control monitoring. Keithley works closely with semiconductor customers worldwide through its network of field service centers and application engineers with specific expertise in the area of semiconductor technology. Registration Information “Practical Tips and Tricks for Avoiding Common Pitfalls When Implementing Parallel Test” will be broadcast on March 26, 2009 at 14:00 Central European Time (9:00 a.m. EDT) for the European audience and at 2:00 p.m. EDT (19:00 Central European Time) for the North American audience. The event is free to the public, but advance registration is required at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast. For more information on Keithley or any of its test solutions, visit www.keithley.com   About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. * * * Products and company names listed are trademarks or trade names of their respective companies.  
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